섹션 설정
GaN Product
Dimension | ⌀ 50.8 ± 0.1 mm | ||
Thickness | 4.5 ± 0.5 ㎛, 20 ± 2 ㎛ | 4.5 ± 0.5 ㎛ | |
Usable Surface Area | > 90% | ||
Orientation | C-Plane (0001) ± 0.5º | ||
Conduction Type | N-type (Undoped) | N-type(Si-doped) | P-type (Mg-doped) |
Resistivity (300K) | < 0.5 Ω·cm | < 0.05 Ω·cm | ~ 10 Ω·cm |
Carrier Concentration | < 5 x 10¹⁷ cmˉ³ | > 1 x 10¹⁸ cmˉ³ | > 6 x 10¹⁶ cmˉ³ |
Mobility | ~ 300 cm² /V·s | ~ 200 cm² /V·s | ~ 10 cm² /V·s |
Dislocation Density | Less than 5 x 10⁸ cmˉ² (estimated by FWHMs of XRD) | ||
Substrate Structure | GaN on sapphire (standard: SSP / option: DSP) | ||
Package | Packaged in a class 100 clean room environment, in cassette of 25pcs or single container, under a nitrogen atmosphere |